FEI Announces World's Most Advanced Electron Microscope

New Titan(TM) (S)TEM, With Resolution Below 0.7 Angstrom, Surpasses Previous

World Record Performance for Commercial Systems

Apr 18, 2005, 01:00 ET from FEI Company

    HILLSBORO, Ore., April 18 /PRNewswire/ -- FEI today announced its new
 scanning/transmission electron microscope (S/TEM), the Titan(TM)
 80-300, dedicated to corrected microscopy.  The new (S)TEM system is the
 world's most advanced commercially-available microscope, yielding atomic-scale
 imaging with resolution below 0.7 Angstrom.  The Titan announcement comes just
 one year after FEI became the first developer and manufacturer of commercial
 electron microscopes to achieve sub-Angstrom resolution on FEI's
 market-leading Tecnai(TM) microscope using a monochromator and an aberration
     (Photo:  http://www.newscom.com/cgi-bin/prnh/20050418/SFM050 )
     Until now, aberration correction technologies in electron microscopes have
 been treated as accessory components for (S)TEM systems that were not truly
 optimized for this type of advanced technology.  Thus, the integration of
 these types of correctors for breaking the next resolution barrier and for
 high usability has been met with limited success.
     The all-new Titan 80-300 is designed as a dedicated and highly-upgradeable
 aberration-corrected system that will enable corrector and monochromator
 technology to enter into mainstream nanotechnology research and industrial
 markets. The Titan (S)TEM system features unparalleled overall stability to
 break the 1-Angstrom barrier. Results from FEI's Nanoport in The Netherlands
 deliver Titan TEM information limits below 0.7 Angstrom and STEM resolution
 just below 1.0 Angstrom, without the addition of aberration corrector upgrades
 -- an achievement that has never before been demonstrated on a commercial
 tool. Corrector upgrades can be added for higher resolution, extending the
 point resolution down to the information limit for accurate interpretation of
 atomic structures.
     The Titan 80-300 has been rigorously evaluated by several leading
 researchers and customers under Non-Disclosure Agreements.  The system will be
 fully available for demonstrations after Titan's official launch at the 2005
 Microscopy and Microanalysis meeting, August 1-4, in Honolulu.
     The upgradeable design of the Titan enables not only larger nanotechnology
 and national research centers to afford dedicated aberration corrected TEM
 technology, it opens the door to universities and companies with staged funds
 to position themselves for the future. FEI has received several advance orders
 for the new Titan (S)TEM ranging from the base Titan 80-300 to the Titan
 80-300 with two aberration correctors and a monochromator.  FEI's
 award-winning and record breaking Tecnai G2 TEM will continue to be marketed
 and supported for customers who do not need aberration-corrected resolution.
 New developments and products for this proven platform will also be introduced
 at the 2005 Microscopy and Microanalysis meeting.
     "The Titan 80-300 is a significant platform for the nanotechnology era.
 It provides our customers a solid foundation for continued innovation and
 commercialization.  FEI's continuing advances in ultra-high TEM resolution,
 coupled with our market-leading focused ion beam (FIB) technologies, deliver
 powerful and vital tools for researchers, developers and manufacturers who are
 increasingly focused on nanoscale discovery and product commercialization,"
 commented Vahe Sarkissian, FEI's chairman and chief executive officer. "As the
 world's leader in providing Tools for Nanotech(TM), FEI will continue to
 invest in the development of these key technologies and market platforms."
     "The initial market response for this advanced technology has been very
 strong," said George Scholes, general manager of FEI's (S)TEM business line.
 "For wide commercialization of this technology we designed the base system
 with a superior level of upgradeability so customers can add an aberration
 corrector, on site at a later date. This will enable customers to obtain
 resolution and capability they need today, knowing that they can expand the
 system's resolution limits as their requirements change."
     Advance orders for the new Titan(TM) (S)TEM have been in markets ranging
 from advanced materials, energy, and semiconductors, to advanced
 nanotechnology research centers in Europe and North America.  FEI believes
 that the Titan will also be a powerful addition to FEI's UltraView(TM) suite
 of sample management tools that takes NanoElectronics customers rapidly from
 wafers to atoms with sub-Angstrom resolution.
     The introduction of the Titan is just one illustration of FEI's leadership
 in electron microscopy and its ability to accelerate the resolution
 revolution. In a November 2004 news release, FEI announced that it was
 selected as the R&D partner for a program aiming to build the highest
 resolution scanning/transmission electron microscope (S/TEM) in the world by
 several regional U.S. laboratories that combined to form the TEAM project.  It
 is a multi-million dollar microscopy project that calls for a new microscope
 that should enable extraordinary new scientific opportunities for direct
 observation aimed at enabling analysis of individual nanostructures at an
 unprecedented resolution of 0.5 Angstrom -- approximately one-third the size
 of a carbon atom.
     About FEI
     FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam
 technologies, deliver 3D characterization, analysis and modification
 capabilities with resolution down to the sub-Angstrom level.  With R&D centers
 in North America and Europe and sales and service operations in more than 40
 countries around the world, FEI is bringing the nanoscale within the grasp of
 leading researchers and manufacturers and helping to turn some of the biggest
 ideas of this century into reality.  More information can be found on the FEI
 website at:  http://www.feicompany.com .
     This news release contains forward-looking statements that include
 statements about future product capability and advanced development program.
 Factors that could affect these forward-looking statements include but are not
 limited to, the inability of FEI, its suppliers or project partners to make
 the technology advances required to achieve the capability described or
 consummate the project described; changes to or cancellation of the project
 described; problems arising during execution of the project or the product
 development that delay it or cause results to vary from the anticipated
 results; unforeseen technology challenges; and failure of a key supplier or
 project partner delays in development funding or customer demand that in turn
 results in the delayed development.  Please also refer to our Form 10-K, Forms
 10-Q and other filings with the U.S. Securities and Exchange Commission for
 additional information on these factors and other factors that could cause
 actual results to differ materially from the forward-looking statements. FEI
 assumes no duty to update forward-looking statements.