HILLSBORO, Ore., Sept. 12 /PRNewswire-FirstCall/ -- FEI Company
(Nasdaq: FEIC) and Malvern Instruments Ltd (Malvern, UK) have entered into
a joint development and marketing program for advanced nanoparticle
analysis utilizing Malvern's particle image analysis software on FEI's line
of Quanta(TM) scanning electron microscopes (SEMs). The combination
delivers a powerful particle analysis solution that extends current
analysis technologies for nano-sized particles.
FEI's Quanta SEMs offer users the flexibility to analyze materials
without imposing many of the traditional SEM sample preparation
constraints, thereby greatly extending the applicability for particle
Malvern's particle image analysis software will be optimized for FEI's
Quanta SEMs. A proven solution, this package is already used on Malvern
systems that encompass traditional optical microscopes, such as the
Morphologi G2, with many research and industrial users around the world.
These systems provide rapid data on particle size and morphology and yield
distribution profiles for quality control and manufacturing applications.
Rationalizing batch to batch variation of materials, identifying crystal
polymorphisms and the identification of foreign bodies are just some of the
"As the size of materials used in product development and manufacturing
continues to move from the microscale into the nanoscale there is an
increasing need for characterization tools that move beyond the limits of
light microscopy," commented Matt Harris, FEI's vice president of worldwide
marketing and business development. "This combination of FEI and Malvern
technologies provides a powerful process and quality control tool for a
growing number of nano-enabled products that are moving into production."
Malvern's Business Development Director, Duncan Roberts said: "The
joint venture with FEI is an exciting development, as this is the first
time that Malvern software has been applied to another company's
instrumentation. Already proven with light microscopy, the execution of
this solution on FEI systems provides SEM users with a powerful new tool."
The bundled solution will be released later this year. It will be
actively promoted to current and potential customers of both FEI and
FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam
technologies, deliver 3D characterization, analysis and modification
capabilities with resolution down to the sub-Angstrom level and provide
innovative solutions for customers working in NanoBiology, NanoResearch and
NanoElectronics. With R&D centers in North America and Europe, and sales
and service operations in more than 50 countries around the world, FEI is
bringing the nanoscale within the grasp of leading researchers and
manufacturers and helping to turn some of the biggest ideas of this century
into reality. More information can be found on the FEI website at:
About Malvern Instruments
Malvern Instruments is a global company that develops, manufactures and
markets advanced analytical systems used in characterizing a wide variety
of materials, from bulk powders to nanomaterials and delicate
macromolecules. Innovative technologies and powerful software produce
systems that deliver industrially relevant data enabling customers to make
the connection between micro (eg particle size) and macro (bulk) material
properties (rheology) and chemical composition (chemical imaging). Malvern
solutions are proven in sectors from cement to pharmaceuticals and support
the understanding, improvement and optimization of many industrial
processes. Extensive industry experience and analytical expertise enable
Malvern to deliver exceptional support to customers worldwide.
This news release contains forward-looking statements that include
statements about new product introduction and performance. Factors that
could affect these forward-looking statements include, but are not limited
to changes to or cancellation of product application development; problems
arising during product rollout that delay the product or cause performance
to fall short of anticipated results; unforeseen technology challenges; and
failure of a key supplier or partner to complete work for the product to
perform successfully. Please also refer to our Form 10-K, Forms 10-Q, Forms
8-K and other filings with the U.S. Securities and Exchange Commission for
additional information on these factors and other factors that could cause
actual results to differ materially from the forward-looking statements.
FEI assumes no duty to update forward-looking statements.
SOURCE FEI Company