FEI Company and Malvern Instruments Team for Nanoparticle Analysis FEI's Quanta(TM) SEMs and Malvern's Advanced Particle Analysis Software

Combine to Deliver Ground-breaking Solution for Nanoscale Applications



    HILLSBORO, Ore., Sept. 12 /PRNewswire-FirstCall/ -- FEI Company
 (Nasdaq:   FEIC) and Malvern Instruments Ltd (Malvern, UK) have entered into
 a joint development and marketing program for advanced nanoparticle
 analysis utilizing Malvern's particle image analysis software on FEI's line
 of Quanta(TM) scanning electron microscopes (SEMs). The combination
 delivers a powerful particle analysis solution that extends current
 analysis technologies for nano-sized particles.
     FEI's Quanta SEMs offer users the flexibility to analyze materials
 without imposing many of the traditional SEM sample preparation
 constraints, thereby greatly extending the applicability for particle
 analysis.
     Malvern's particle image analysis software will be optimized for FEI's
 Quanta SEMs. A proven solution, this package is already used on Malvern
 systems that encompass traditional optical microscopes, such as the
 Morphologi G2, with many research and industrial users around the world.
 These systems provide rapid data on particle size and morphology and yield
 distribution profiles for quality control and manufacturing applications.
 Rationalizing batch to batch variation of materials, identifying crystal
 polymorphisms and the identification of foreign bodies are just some of the
 current applications.
     "As the size of materials used in product development and manufacturing
 continues to move from the microscale into the nanoscale there is an
 increasing need for characterization tools that move beyond the limits of
 light microscopy," commented Matt Harris, FEI's vice president of worldwide
 marketing and business development. "This combination of FEI and Malvern
 technologies provides a powerful process and quality control tool for a
 growing number of nano-enabled products that are moving into production."
     Malvern's Business Development Director, Duncan Roberts said: "The
 joint venture with FEI is an exciting development, as this is the first
 time that Malvern software has been applied to another company's
 instrumentation. Already proven with light microscopy, the execution of
 this solution on FEI systems provides SEM users with a powerful new tool."
     The bundled solution will be released later this year. It will be
 actively promoted to current and potential customers of both FEI and
 Malvern Instruments.
     About FEI
     FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam
 technologies, deliver 3D characterization, analysis and modification
 capabilities with resolution down to the sub-Angstrom level and provide
 innovative solutions for customers working in NanoBiology, NanoResearch and
 NanoElectronics. With R&D centers in North America and Europe, and sales
 and service operations in more than 50 countries around the world, FEI is
 bringing the nanoscale within the grasp of leading researchers and
 manufacturers and helping to turn some of the biggest ideas of this century
 into reality. More information can be found on the FEI website at:
 www.fei.com .
     About Malvern Instruments
     Malvern Instruments is a global company that develops, manufactures and
 markets advanced analytical systems used in characterizing a wide variety
 of materials, from bulk powders to nanomaterials and delicate
 macromolecules. Innovative technologies and powerful software produce
 systems that deliver industrially relevant data enabling customers to make
 the connection between micro (eg particle size) and macro (bulk) material
 properties (rheology) and chemical composition (chemical imaging). Malvern
 solutions are proven in sectors from cement to pharmaceuticals and support
 the understanding, improvement and optimization of many industrial
 processes. Extensive industry experience and analytical expertise enable
 Malvern to deliver exceptional support to customers worldwide.
 www.malvern.com .
     This news release contains forward-looking statements that include
 statements about new product introduction and performance. Factors that
 could affect these forward-looking statements include, but are not limited
 to changes to or cancellation of product application development; problems
 arising during product rollout that delay the product or cause performance
 to fall short of anticipated results; unforeseen technology challenges; and
 failure of a key supplier or partner to complete work for the product to
 perform successfully. Please also refer to our Form 10-K, Forms 10-Q, Forms
 8-K and other filings with the U.S. Securities and Exchange Commission for
 additional information on these factors and other factors that could cause
 actual results to differ materially from the forward-looking statements.
 FEI assumes no duty to update forward-looking statements.
 
 

SOURCE FEI Company

Custom Packages

Browse our custom packages or build your own to meet your unique communications needs.

Start today.

 

PR Newswire Membership

Fill out a PR Newswire membership form or contact us at (888) 776-0942.

Learn about PR Newswire services

Request more information about PR Newswire products and services or call us at (888) 776-0942.