HILLSBORO, Ore., Nov. 10 /PRNewswire-FirstCall/ -- Ohio State University's
Center for Accelerated Maturation of Materials (CAMM) has become the first
North American site to install and begin using the world's highest-resolution,
commercially-available scanning/transmission electron (S/TEM) microscope, the
FEI (Nasdaq: FEIC) Titan(TM) 80-300. This new system yields powerful
sub-Angstrom (atomic scale) imaging and analysis capabilities.
With the sub-Angstrom imaging of the Titan, researchers at Ohio State's
CAMM labs will have a greatly enhanced ability to make new discoveries on the
structure-property relationships of a wide spectrum of materials. Close
coupling of computational methods with the now more detailed experimental
validation at the atomic level will make new materials development cycles much
shorter at significantly reduced costs.
"CAMM embarked upon a joint project with FEI Company to develop an
advanced S/TEM platform aimed at providing researchers with an accurate
physical picture of the materials they are modeling," said Dr. Hamish Fraser,
director of CAMM. "We are happy and enthusiastic to see that it has resulted
in such a powerful tool -- on time and beyond performance expectations -- that
will play an indispensable role in our effort to develop new methods for
sophisticated characterization and computational models to accelerate new
materials development cycles. The demonstrated quality and stability -- from
crate to sub-Angstrom in just one week -- has created excitement among our
students and post doctorates."
The Titan's dedicated platform for corrector and monochromator
technologies is highly automated and provides leading-edge stability,
performance and flexibility. The microscope enables deep sub-angstrom
resolution making way for the highest performance available in both
transmission electron microscopy (TEM) and scanning transmission electron
microscopy (STEM) modes. The Titan's upgradeable design not only enables
larger nanotechnology and national research centers to afford dedicated
aberration corrected TEM technology, it opens the door to universities and
companies with staged funds to position themselves for the future.
"The FEI Titan S/TEM is an extraordinarily powerful and stable system,"
said Rob Fastenau, senior vice president of FEI's NanoResearch and NanoBiology
market divisions. "Shortly after the installation at Ohio State was completed,
the system was able to produce an information limit around 0.7 Angstrom and
atomic resolution in STEM mode within minutes of each application. It is this
very flexibility, stability and performance that will allow combining ultimate
information with new results and have high analysis throughput."
The Titan S/TEM was introduced in August of this year. Additional
installations of the first-shipped systems will soon be completed in North
America and Europe.
CAMM at Ohio State University is a unique collaboration between government,
industry and academia chartered to develop new methods to accelerate the
maturation of materials technologies. It seeks to combine computational tools
with thorough experimental validation, and one of its tasks is the development
of new experimental tools, where needed. The joint development of this new
tool is an excellent example of the collaborative efforts that are required to
maintain a competitive position in industrial segments that depend on evolving
FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam
technologies, deliver 3D characterization, analysis and modification
capabilities with resolution down to the sub-Angstrom level. With R&D centers
in North America and Europe and sales and service operations in more than
40 countries around the world, FEI is bringing the nanoscale within the grasp
of leading researchers and manufacturers and helping to turn some of the
biggest ideas of this century into reality. More information can be found on
the FEI website at: http://www.feicompany.com .
This news release contains forward-looking statements that include
statements about future performance and new applications of, and development
work through, our Titan TEM. Factors that could affect these forward-looking
statements include but are not limited to the inability of customers to
develop and deploy the expected new applications or to achieve the development
work. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and other
filings with the U.S. Securities and Exchange Commission for additional
information on these factors and other factors that could cause actual results
to differ materially from the forward-looking statements. FEI assumes no duty
to update forward-looking statements.
SOURCE FEI Company