FEI Launches Top-of-the-Line Research DualBeam at M&M

Helios NanoLab(TM) DualBeam Will Enable Industry-Leading Nanoscale Imaging,

Analysis, Fabrication and Sample Prep Applications

Jul 31, 2006, 01:00 ET from FEI Company

    HILLSBORO, Ore., July 31 /PRNewswire-FirstCall/ -- The next generation
 of combined focused ion beam (FIB) and scanning electron microscope (SEM)
 technology for research will be unveiled today when FEI Company (Nasdaq:  
 FEIC) releases its all-new Helios NanoLab(TM) DualBeam(TM) at Microscopy
 and Microanalysis 2006 in Chicago.
     The Helios NanoLab features a new ultra-high resolution field emission
 SEM column combined with FEI's widely acclaimed Sidewinder(TM) FIB column
 and gas chemistries to provide new levels of imaging resolution and
 contrast in a DualBeam system. It also delivers enhanced stability and
 optimized operation within a wide range of parameters. The new small
 DualBeam platform enables industry-leading 3D characterization, analysis
 and image reconstruction applications, nano-prototyping (fabrication and
 testing) capabilities, and high-quality sample prep abilities for
 researchers and developers needing to reach deep into the nanoscale.
     "The Helios NanoLab was designed to address the demanding requirements
 of our growing base of DualBeam users in both research and product
 development environments," said Rob Fastenau, senior vice president of
 FEI's NanoResearch and Industry market division. "FEI continues to lead
 innovation in combined FIB/SEM solutions. We believe that users of this
 all-new DualBeam platform will be able to achieve ground-breaking results
 in multiple applications with accuracy and repeatability."
     With its advanced sample preparation capabilities, the Helios NanoLab
 complements FEI's Titan S/TEM -- the world's most powerful microscope --
 which continues to receive industry acclaim since its launch at last year's
 Microscopy & Microanalysis show. The Helios system enables fast and precise
 preparation of the thinnest S/TEM samples with little damage to samples.
 Together, the Helios NanoLab and the Titan S/TEM represent the highest-
 performance tool set currently available on the commercial market.
     FEI introduced the world's first combined FIB/SEM system in 1993. Since
 2000, it has sold more than 350 small stage DualBeam systems worldwide.
     About FEI
     FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam
 technologies, deliver 3D characterization, analysis and modification
 capabilities with resolution down to the sub-Angstrom level and provide
 innovative solutions for customers working in NanoBiology, NanoResearch and
 NanoElectronics. With R&D centers in North America and Europe, and sales
 and service operations in more than 50 countries around the world, FEI is
 bringing the nanoscale within the grasp of leading researchers and
 manufacturers and helping to turn some of the biggest ideas of this century
 into reality. More information can be found on the FEI website at:
     This news release contains forward-looking statements that include
 statements about performance of a newly-introduced product and future
 product performance. Factors that could affect these forward-looking
 statements include, but are not limited to changes to or cancellation of
 product application development initiatives; problems arising during
 product rollout that delay it or cause results to vary from the anticipated
 results; unforeseen technology challenges; and failure of a key supplier or
 partner. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and
 other filings with the U.S. Securities and Exchange Commission for
 additional information on these factors and other factors that could cause
 actual results to differ materially from the forward-looking statements.
 FEI assumes no duty to update forward-looking statements.