HILLSBORO, Ore., July 31 /PRNewswire-FirstCall/ -- The next generation
of combined focused ion beam (FIB) and scanning electron microscope (SEM)
technology for research will be unveiled today when FEI Company (Nasdaq:
FEIC) releases its all-new Helios NanoLab(TM) DualBeam(TM) at Microscopy
and Microanalysis 2006 in Chicago.
The Helios NanoLab features a new ultra-high resolution field emission
SEM column combined with FEI's widely acclaimed Sidewinder(TM) FIB column
and gas chemistries to provide new levels of imaging resolution and
contrast in a DualBeam system. It also delivers enhanced stability and
optimized operation within a wide range of parameters. The new small
DualBeam platform enables industry-leading 3D characterization, analysis
and image reconstruction applications, nano-prototyping (fabrication and
testing) capabilities, and high-quality sample prep abilities for
researchers and developers needing to reach deep into the nanoscale.
"The Helios NanoLab was designed to address the demanding requirements
of our growing base of DualBeam users in both research and product
development environments," said Rob Fastenau, senior vice president of
FEI's NanoResearch and Industry market division. "FEI continues to lead
innovation in combined FIB/SEM solutions. We believe that users of this
all-new DualBeam platform will be able to achieve ground-breaking results
in multiple applications with accuracy and repeatability."
With its advanced sample preparation capabilities, the Helios NanoLab
complements FEI's Titan S/TEM -- the world's most powerful microscope --
which continues to receive industry acclaim since its launch at last year's
Microscopy & Microanalysis show. The Helios system enables fast and precise
preparation of the thinnest S/TEM samples with little damage to samples.
Together, the Helios NanoLab and the Titan S/TEM represent the highest-
performance tool set currently available on the commercial market.
FEI introduced the world's first combined FIB/SEM system in 1993. Since
2000, it has sold more than 350 small stage DualBeam systems worldwide.
FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam
technologies, deliver 3D characterization, analysis and modification
capabilities with resolution down to the sub-Angstrom level and provide
innovative solutions for customers working in NanoBiology, NanoResearch and
NanoElectronics. With R&D centers in North America and Europe, and sales
and service operations in more than 50 countries around the world, FEI is
bringing the nanoscale within the grasp of leading researchers and
manufacturers and helping to turn some of the biggest ideas of this century
into reality. More information can be found on the FEI website at:
This news release contains forward-looking statements that include
statements about performance of a newly-introduced product and future
product performance. Factors that could affect these forward-looking
statements include, but are not limited to changes to or cancellation of
product application development initiatives; problems arising during
product rollout that delay it or cause results to vary from the anticipated
results; unforeseen technology challenges; and failure of a key supplier or
partner. Please also refer to our Form 10-K, Forms 10-Q, Forms 8-K and
other filings with the U.S. Securities and Exchange Commission for
additional information on these factors and other factors that could cause
actual results to differ materially from the forward-looking statements.
FEI assumes no duty to update forward-looking statements.
SOURCE FEI Company