FEI's Titan(TM) S/TEM Receives Industry Honors

World's Most Advanced Commercial Electron Microscope Impresses Both Industry

Experts and Customers

Jan 31, 2006, 00:00 ET from FEI

    HILLSBORO, Ore., Jan. 31 /PRNewswire/ -- Within months of its release,
 FEI's Titan(TM) scanning transmission electron microscope (S/TEM), the world's
 most powerful, commercially-available microscope, has earned four prestigious
 awards for its design, performance and innovation.  Awards include the coveted
 iF Design Award bestowed by the International Design Forum (iF) in Hannover,
 Germany, and the Innovative Product of the Year Award presented by the Oregon
 Tech Awards in the United States.  The Titan S/TEM was also selected by
 editorial boards as one of the Top Products of 2005 by Solid State Technology
 magazine and one of the Greatest Hits of 2005 by MICRO magazine.
     Known throughout the world as one of the most prestigious distinctions for
 manufacturers, the iF Product Design Award is presented in recognition of
 superior product design.  Like the IDEA (Industrial Design Excellence Awards)
 in the United States, the iF awards represent the best product design in
 Europe.  Winning products are selected from more than 2000 entrants in more
 than 30 countries and are judged on several levels, including design quality,
 material compatibility, innovation, environmental consideration, convenience,
 stability and durability.  The industrial design of the Titan S/TEM was
 developed for FEI by Philips Design.
     "We are extremely honored to receive these recognitions from the
 industry," said George D. Scholes, FEI's vice president who led FEI's TEM
 business.  "The Titan's sub-Angstrom resolution, high stability, reliability
 and overall ease-of-use have set a new standard for aberration-corrected S/TEM
 imaging, and customer reaction to the Titan has been very favorable.  Its
 performance and flexibility are designed to meet the ultra-high resolution
 requirements for our customers working in NanoResearch and Industry, and
 NanoElectronics for many years to come.  The new platform also holds promise
 for the growing number of advanced application in NanoBiology and
 pharmaceutical development."
     The Titan microscope enables deep sub-Angstrom resolution making way for
 the highest performance available in both transmission electron microscopy
 (TEM) and scanning transmission electron microscopy (STEM) modes.  The import
 of ultra-high resolution imaging continues to grow as advanced research work
 continues deep into the nanoscale, semiconductor manufacturers push beyond the
 45 nm node for design and manufacturing, and government regulatory agencies
 around the world see a growing need to characterize the smallest of
     The first Titan S/TEMs were installed in the second half of 2005.
 Additional installations are currently underway around the world and FEI is
 increasing production to keep up with demand.
     About the iF Design Awards
     The iF Design Awards, which were established in 1954, are supervised by
 the International Design Forum (iF) in Hannover, Germany.  iF has acquired an
 international reputation as a leading industrial design institution.  iF is
 committed to supporting the cause of industrial design and raising awareness
 among industrial decision-makers on the crucial impact that design can have on
 successful product marketing.  For additional information on the iF awards,
 please visit http://www.ifdesign.de .
     About FEI
     FEI's Tools for Nanotech(TM), featuring focused ion- and electron-beam
 technologies, deliver 3D characterization, analysis and modification
 capabilities with resolution down to the sub-Angstrom level.  With R&D centers
 in North America and Europe and sales and service operations in more than 40
 countries around the world, FEI is bringing the nanoscale within the grasp of
 leading researchers and manufacturers and helping to turn some of the biggest
 ideas of this century into reality.  More information can be found on the FEI
 Web site at: http://www.feicompany.com .