Nova Broadens Its Customer Base By Gaining Another 2 Large Customers 18 Out of the 20 Largest Manufacturers Are Now Using Nova's Integrated

Metrology Solutions



    REHOVOTH, Israel, Nov. 10 /PRNewswire-FirstCall/ -- Nova Measuring
 Instruments (Nasdaq:   NVMI) today announced the successful implementation of
 its advanced process control (APC) through the use of the NovaScan 2040
 integrated metrology systems, integrated in the STI CMP polishers, at a world
 leading IC Manufacturer in Taiwan and has gained another top 20 semiconductor
 manufacturers in Japan.  This implementation significantly reduces rework rate
 and metrology, while improving post-CMP thickness variation on the wafers
 produced in 0.13 Cu technology.
     The NovaScan 2040 and 3060 have an overall measurement time of 13 seconds
 per wafer for 13 sites, compatible with all high-throughput polishers,
 enabling measurement and mapping of all wafers both pre- and post-polish
 without affecting the polisher's throughput. Nova is the only Integrated
 Metrology provider to offer both wet and dry integrations allowing customers
 to choose the best alternative. The NovaScan 2040/3060 utilizes UV
 Spectrophotometry to accurately measure and map the most advanced applications
 in the semiconductor industry down to the 0.095m technology node.
     According to a world leading IC manufacturer from Taiwan, rework rate was
 reduced by more than 5 times after employing the NovaScan 2040 integrated
 metrology system inside the STI CMP polisher. Post-CMP thickness variation has
 been improved by 60% and metrology delays were significantly reduced. At a
 presentation during the AEC/APC conference in Colorado Springs in September
 2003 the customer noted: "Integrated Metrology is a key enabler for
 wafer-to-wafer control."
     Ronen Frish, VP Sales and Marketing comments: "We have been trying for
 years to provide these capabilities to this large customer, and we are very
 proud that we have now become one of their suppliers. The evaluation of the
 system has been very successful, and the systems are now in full production
 use. In addition we have delivered first systems to a new customer in Japan,
 so that we are now supplying NovaScan Integrated Metrology systems to 18 out
 of the top 20 semiconductor manufacturers; this is the best proof of the
 success of our pioneering integrated metrology concept and our leading
 position in the market. The move to 300mm wafers, 0.09 micron design rules and
 to copper/low-k is providing more opportunities to the company's integrated
 metrology solutions."
 
     About Nova:
     Nova Measuring Instruments Ltd. develops, designs and produces integrated
 process control systems in the semiconductor manufacturing industry. Nova
 provides a broad range of integrated process control solutions that link
 different semiconductor processes and process equipment. The Company's website
 is www.nova.co.il.
 
      Company Contacts:
      Dr. Giora Dishon
      Nova Measuring Instruments Ltd.
      Tel: +972-8-9387505
      E-mail: info@nova.co.il
      Web:    http://www.nova.co.il
 
      Company Contact:                       Investor relations Contacts:
      Chai Toren, CFO and Vice President     Ehud Helft / Kenny Green
      Nova Measuring Instruments Ltd.        Gal IR International
      Tel: +972-8-938-7505                   Tel: +1-866-704-6710
      E-mail: info@nova.co.il                E-mail : Ehud.Helft@galir.com
      http://www.nova.co.il                           Kenny.Green@galir.com
 
 

SOURCE Nova Measuring Instruments Ltd.

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