REHOVOTH, Israel, Nov. 10 /PRNewswire-FirstCall/ -- Nova Measuring Instruments (Nasdaq: NVMI) today announced the successful implementation of its advanced process control (APC) through the use of the NovaScan 2040 integrated metrology systems, integrated in the STI CMP polishers, at a world leading IC Manufacturer in Taiwan and has gained another top 20 semiconductor manufacturers in Japan. This implementation significantly reduces rework rate and metrology, while improving post-CMP thickness variation on the wafers produced in 0.13 Cu technology. The NovaScan 2040 and 3060 have an overall measurement time of 13 seconds per wafer for 13 sites, compatible with all high-throughput polishers, enabling measurement and mapping of all wafers both pre- and post-polish without affecting the polisher's throughput. Nova is the only Integrated Metrology provider to offer both wet and dry integrations allowing customers to choose the best alternative. The NovaScan 2040/3060 utilizes UV Spectrophotometry to accurately measure and map the most advanced applications in the semiconductor industry down to the 0.095m technology node. According to a world leading IC manufacturer from Taiwan, rework rate was reduced by more than 5 times after employing the NovaScan 2040 integrated metrology system inside the STI CMP polisher. Post-CMP thickness variation has been improved by 60% and metrology delays were significantly reduced. At a presentation during the AEC/APC conference in Colorado Springs in September 2003 the customer noted: "Integrated Metrology is a key enabler for wafer-to-wafer control." Ronen Frish, VP Sales and Marketing comments: "We have been trying for years to provide these capabilities to this large customer, and we are very proud that we have now become one of their suppliers. The evaluation of the system has been very successful, and the systems are now in full production use. In addition we have delivered first systems to a new customer in Japan, so that we are now supplying NovaScan Integrated Metrology systems to 18 out of the top 20 semiconductor manufacturers; this is the best proof of the success of our pioneering integrated metrology concept and our leading position in the market. The move to 300mm wafers, 0.09 micron design rules and to copper/low-k is providing more opportunities to the company's integrated metrology solutions." About Nova: Nova Measuring Instruments Ltd. develops, designs and produces integrated process control systems in the semiconductor manufacturing industry. Nova provides a broad range of integrated process control solutions that link different semiconductor processes and process equipment. The Company's website is www.nova.co.il. Company Contacts: Dr. Giora Dishon Nova Measuring Instruments Ltd. Tel: +972-8-9387505 E-mail: firstname.lastname@example.org Web: http://www.nova.co.il Company Contact: Investor relations Contacts: Chai Toren, CFO and Vice President Ehud Helft / Kenny Green Nova Measuring Instruments Ltd. Gal IR International Tel: +972-8-938-7505 Tel: +1-866-704-6710 E-mail: email@example.com E-mail : Ehud.Helft@galir.com http://www.nova.co.il Kenny.Green@galir.com
SOURCE Nova Measuring Instruments Ltd.