Nova Measuring Instruments Introduces The NovaScan 3060, the Fastest Integrated Metrology System available for 300mm CMP Processes

New System Enables Advanced Dielectric and Conductor Thickness Measurements

and Control for Both In-Air and In-Water 300mm CMP Applications

Dec 02, 2002, 00:00 ET from Nova Measuring Instruments Ltd.

    REHOVOTH, Israel, Dec. 2 /PRNewswire-FirstCall/ --
 Nova Measuring Instruments Ltd. (Nasdaq:    NVMI), the market leader in
 integrated measurement and process control for the semiconductor industry,
 announced today the launch of the NovaScan 3060, the fastest Integrated
 Metrology system on the market for high-end 300mm chemical mechanical
 polishing (CMP) applications.
     The NovaScan 3060 has an overall measurement time of 13 seconds per wafer
 for 13 sites, compatible with all high-throughput polishers, enabling
 measurement and mapping of all wafers both pre- and post-polish without
 affecting the polisher's throughput.
     Nova is the only Integrated Metrology provider to offer both wet and dry
 integrations.  This allows customers to choose the best alternative, based on
 both BKM (Best-Known Method) as well as price and performance considerations.
 The NovaScan 3060 utilizes UV spectrophotometry to accurately measure and map
 the most advanced applications in the semiconductor industry down to the
 0.09um technology.  The NovaScan 3060 is a natural extension of the existing
 NovaScan series, enabling semiconductor manufacturers to easily upgrade
 production lines from 200mm to 300mm, and to continue successfully
 implementing wafer to wafer closed loop control (CLC).  In addition to the
 high speed and advanced technology, the NovaScan 3060 works with new operating
 software, which supports the unit's new capabilities without sacrificing ease
 of use.  The NovaScan 3060's patented, non-contact in-air and in-water
 thickness measurement technology eliminates operator handling or intervention,
 and eliminates the need for external verification after cleaning and drying.
     Commenting on the announcement, Mr. Rani Kipper, Manager of Nova's Film
 Division said, "We at Nova are committed to providing our customers with the
 most advanced integrated process control solutions for a wide range of
 applications throughout the manufacturing line.  In today's environment, as
 new polishers become increasingly faster, it's only logical that integrated
 metrology within the polisher will become faster in order to keep up.  Being
 the fastest and most advanced system on the market, the NovaScan 3060 provides
 a logical upgrade path for semiconductor manufacturers.  Operating in either
 air or water, this advanced integrated platform has been designed to meet all
 high-end application requirements while enhancing throughput and maximizing
 return on investment."
     Nova's will display at Semicon Japan 2002. Visit Nova's booth # 2-A902, at
 Makuhari next to Tokyo, December 4 to 6, and learn more about the company's
 new Integrated Process Control products and solutions.
     About Nova: Nova Measuring Instruments Ltd. develops, designs and produces
 integrated process control systems in the semiconductor manufacturing
 industry.  Nova provides a broad range of integrated process control solutions
 that link between different semiconductor processes and process equipment.
 The company's web site is
      Company Contact:
      Chai Toren, Chief Financial Officer
      Nova Measuring Instruments Ltd.
      Tel: 972-8-938-7505
      Investor Relations Contacts:
      Evan Smith / Madelene Glomsten
      KCSA Public Relations Worldwide
      Tel: 212-896-1220 / 212-896-1258
      E-mail: /
     This press release may contain forward-looking statements, including
 statements related to anticipated growth rates, manufacturing capacity and tax
 rate. Actual results may differ materially from those projected due to a
 number of risks, including changes in customer demands for our products, new
 product offerings from our competitors, changes in or an inability to execute
 our business strategy, unanticipated manufacturing or supply problems, or
 changes in tax requirements. Nova cannot guarantee future results, levels of
 activity, performance or achievements. The matters discussed in this press
 release also involve risks and uncertainties summarized under the heading
 ``Risk Factors'' in Nova's Form F-1 filed with the Securities and Exchange
 Commission on April 9, 2000. These factors are updated from time to time
 through the filing of reports and registration statements with the Securities
 and Exchange Commission. Nova Measuring Instruments Ltd. does not assume any
 obligation to update the forward-looking information contained in this press

SOURCE Nova Measuring Instruments Ltd.