BOUCHERVILLE, QC, Nov. 8 /PRNewswire/ - SolVision Inc., a leading provider of automated visual inspection equipment for the semiconductor industry, has been selected as the Quebec recipient of the 2006 NRC-IRAP Regional Award for New Technology based on the company's Fast Moire Interferometry(TM) (FMI(TM)) technology. The award, presented jointly by the National Research Council Industrial Research Assistance Program (NRC-IRAP) and Canadian Manufacturers & Exporters (CME), recognizes innovative excellence for Canadian SMEs in the development of a new technology or the adoption and application of a new technology in process or new development. Selected from more than 70 contenders, SolVision won the award for its patented FMI technology, which allows microelectronics components to be inspected with sub-micron precision at inspection speeds over 40 times faster than alternative methods. Applications for this inspection technology include the semiconductor and microelectronics manufacturing and packaging industries, namely wafer bumping, flip-chip substrate assembly and IC packaging (including microprocessors, memory chips and large ASICs). "We are extremely honored to have been selected as the winner of this prestigious award for the Quebec region," said Alain Coulombe, president of SolVision. "FMI technology has contributed to important advancements in microelectronics inspection and, with continued application, will play a major role in establishing Canada as a leader in the international 3D vision inspection industry," added Coulombe. As one of seven regional award winners from across Canada, SolVision was also a finalist in the national NRC-IRAP awards and was presented with a Certificate of Merit at the CME's Sixth Annual Canadian Innovation Awards Gala in Calgary on October 3, 2006. About FMI Technology Inspired by the principles of moire interferometry, Fast Moire Interferometry technology captures X, Y and Z measurements for every pixel with unmatched accuracy, repeatability and throughput. Using high-resolution cameras in combination with a pattern projector, FMI technology analyzes the entire field of view (FOV) to obtain 3D and 2D measurements concurrently. The scalability of FMI technology permits the use of multiple camera types for various application areas and allows multiple components to be encompassed in a single FOV, ensuring faster data acquisition and higher throughputs. About SolVision SolVision is a leading designer and manufacturer of high-performance automated visual inspection equipment for the microelectronics industry. Founded by former IBM foundry managers and scientists from the microelectronics manufacturing sector, SolVision combines more than a decade of industry expertise with its patented FMI(TM) technology to set new standards in performance and accuracy for visual inspection - including wafer, FC substrate and advanced IC packaging inspection. As the semiconductor industry pushes testing criteria from micro- to nanotechnology, SolVision provides unique platforms that address today's needs and stand poised for tomorrow's challenges. For more information about SolVision, please visit our website at www.solvision.net.
SOURCE Solvision Inc.