BOUCHERVILLE, QC, Nov. 8 /PRNewswire/ - SolVision Inc., a leading
provider of automated visual inspection equipment for the semiconductor
industry, has been selected as the Quebec recipient of the 2006 NRC-IRAP
Regional Award for New Technology based on the company's Fast Moire
Interferometry(TM) (FMI(TM)) technology.
The award, presented jointly by the National Research Council
Industrial Research Assistance Program (NRC-IRAP) and Canadian
Manufacturers & Exporters (CME), recognizes innovative excellence for
Canadian SMEs in the development of a new technology or the adoption and
application of a new technology in process or new development.
Selected from more than 70 contenders, SolVision won the award for its
patented FMI technology, which allows microelectronics components to be
inspected with sub-micron precision at inspection speeds over 40 times
faster than alternative methods. Applications for this inspection
technology include the semiconductor and microelectronics manufacturing and
packaging industries, namely wafer bumping, flip-chip substrate assembly
and IC packaging (including microprocessors, memory chips and large ASICs).
"We are extremely honored to have been selected as the winner of this
prestigious award for the Quebec region," said Alain Coulombe, president of
SolVision. "FMI technology has contributed to important advancements in
microelectronics inspection and, with continued application, will play a
major role in establishing Canada as a leader in the international 3D
vision inspection industry," added Coulombe.
As one of seven regional award winners from across Canada, SolVision
was also a finalist in the national NRC-IRAP awards and was presented with
a Certificate of Merit at the CME's Sixth Annual Canadian Innovation Awards
Gala in Calgary on October 3, 2006.
About FMI Technology
Inspired by the principles of moire interferometry, Fast Moire
Interferometry technology captures X, Y and Z measurements for every pixel
with unmatched accuracy, repeatability and throughput.
Using high-resolution cameras in combination with a pattern projector,
FMI technology analyzes the entire field of view (FOV) to obtain 3D and 2D
measurements concurrently. The scalability of FMI technology permits the
use of multiple camera types for various application areas and allows
multiple components to be encompassed in a single FOV, ensuring faster data
acquisition and higher throughputs.
SolVision is a leading designer and manufacturer of high-performance
automated visual inspection equipment for the microelectronics industry.
Founded by former IBM foundry managers and scientists from the
microelectronics manufacturing sector, SolVision combines more than a
decade of industry expertise with its patented FMI(TM) technology to set
new standards in performance and accuracy for visual inspection - including
wafer, FC substrate and advanced IC packaging inspection. As the
semiconductor industry pushes testing criteria from micro- to
nanotechnology, SolVision provides unique platforms that address today's
needs and stand poised for tomorrow's challenges.
For more information about SolVision, please visit our website at
SOURCE Solvision Inc.