Xradia Announces $2.0M Contract for Hard X-ray Nanoprobe Instrument

Jun 05, 2006, 01:00 ET from Argonne National Laboratory and Xradia, Inc.

    CONCORD, Calif., and ARGONNE, Ill., June 5 /PRNewswire/ -- Xradia,
 Inc., a developer and manufacturer of ultra-high-resolution x-ray imaging
 systems for 3D tomography and nanotechnology applications, today announced
 the award of a $2M contract from the Argonne National Laboratory's Center
 for Nanoscale Materials (CNM). The contract calls for the participation in
 the design and engineering of a high resolution hard x-ray nanoprobe
 instrument (NPI) for 30nm high-resolution elemental and structural analysis
 using scanning probe and full-field transmission x-ray microscopy. The NPI
 will be installed at the Hard X-ray Nanoprobe Beamline at Argonne's
 Advanced Photon Source (APS) as part of a joint development effort between
 the CNM and APS.
     (Photo: http://www.newscom.com/cgi-bin/prnh/20060605/CGM039 )
     High resolution x-ray microscopy is of growing importance for research
 and industry in such diverse fields as alternative energy, advanced
 semiconductor development, bio technology and life sciences, advanced
 materials and nanotechnology. The unique ability of x-rays to penetrate
 samples of interest non-destructively, combined with x-ray optics that
 enable high-resolution microscopy, gives researchers and engineers
 unprecedented access to knowledge about the inner structure and nature of
 objects both man-made and natural in origin. The NPI will be one of the
 major characterization tools at the Center for Nanoscale Materials. "The
 Hard X-ray Nanoprobe will provide x-ray characterization at a spatial
 resolution of 30nm which substantially exceeds the optical limit," said Dr.
 Eric Isaacs, Director of CNM. "When integrated with CNM's materials
 synthesis, fabrication, theory and other characterization capabilities, the
 NPI will revolutionize the design of materials at the nanoscale," said
     "This project will push the state of the art in x-ray microscopy to new
 levels of resolution, both in terms of x-ray optics, and precision
 mechanical design," said Dr. Jorg Maser, principal researcher at the Center
 for Nanoscale Materials. "With their commercial leadership in x-ray optics,
 and turnkey x-ray microscope instrumentation, Xradia is specially qualified
 to contribute to the design and to execute much of the system
 construction," said Maser.
     "We are delighted to be teaming up with CNM on this critical program,"
 said Dr. Wenbing Yun, president and founder of Xradia. "Pushing x-ray
 optics to new levels of resolution, and marrying that with advanced system
 design and imaging software, opens up exciting new applications in a wide
 range of disciplines and also helps Xradia's commercial systems stay at the
 forefront," said Yun.
     About Xradia, Inc.
     Xradia, Inc. is a privately held company established in 2000 to
 commercialize high-resolution x-ray microscopes for nondestructive
 inspection and nano-scale imaging. Initially targeted at failure analysis
 in the semiconductor IC industry, subsequent developments have led to a
 suite of commercial x-ray imaging products that have permitted expansion
 into markets that include metrology in semiconductor IC production,
 scientific equipment, biomedical research and nanotechnology development.
     About Argonne National Laboratory
     The nation's first national laboratory, Argonne National Laboratory
 conducts basic and applied scientific research across a wide spectrum of
 disciplines, ranging from high-energy physics to climatology and
 biotechnology. Since 1990, Argonne has worked with more than 600 companies
 and numerous federal agencies and other organizations to help advance
 America's scientific leadership and prepare the nation for the future.
 Argonne is managed by the University of Chicago for the U.S. Department of
 Energy's Office of Science.

SOURCE Argonne National Laboratory and Xradia, Inc.