IEEE Teams With IBM to Publish Prestigious Journals

PISCATAWAY, N.J., April 7 /PRNewswire/ -- IEEE, the world's largest technical professional association, recently announced that the IBM Journal of Research and Development is now available online as part of the IEEE Xplore® digital library. IEEE and IBM have entered into an agreement to offer expanded access to all papers ever published in the top-cited journal, which now includes the IBM Systems Journal. Both peer-reviewed technical journals are leaders in addressing advancements in science, technology and engineering of information systems.

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The IBM Journal of Research and Development and IBM Systems Journal have been published online since 1998. In 2009, they merged into one fee-based online publication. Now, the combined journals and the complete back issue archives are available to researchers through the IEEE Xplore digital library.

"This marks the second major addition to IEEE Xplore digital library in 2010," said Karen Hawkins, director of product management at IEEE. "We're pleased to add the IBM Journal of Research and Development to other recent expansions of the IEEE Xplore digital library, including the IEEE-Wiley eBooks collection, and journals from the American Institute of Physics (AIP) and AVS."

Going forward, IEEE assumes responsibility for article production, copy editing, data conversion, online hosting and maintenance. IBM will be in charge of content acquisition and peer review.

"IBM is proud to join IEEE in the combined publication of the IBM Journal of Research and Development and the IBM Systems Journal beginning immediately," said Dr. John J. Ritsko, Editor-in-Chief, IBM Technical Journals. "With more than four million users coming to IEEE Xplore each month, this collaboration will achieve the widest possible distribution for technical readers as well as enable efficient and sustainable publication of these leadership journals."

With the IBM journals add-on subscription, IEEE Xplore users will have access to:

• The backfiles of two prestigious IBM journals:
  • IBM Journal of Research and Development
  • IBM Systems Journal (1962–2008)
• Full-text PDFs of all issues from 1957
• More than 5,000 articles in all, published bimonthly in IEEE Xplore
• Topics including circuits, cloud computing, data preservation, spintronics, systems biology, virtual appliances, and more
• Affordable access to the same top-cited information used by today's most innovative companies and researchers
• All the robust, intuitive features of the recently upgraded and expanded IEEE Xplore digital library

For more information, please visit www.ieee.org/go/ibmjournal.

About IBM Journal of Research and Development

The journal was launched in 1957 by Thomas J. Watson Jr., IBM president and CEO, who viewed it as "a strong indication of the increasing emphasis we at IBM want to place in the future on fundamental science and technology." In 1962 as the computer industry grew, the IBM Systems Journal was added to report advances in software, software systems, and eventually services. These peer-reviewed journals have provided corporate professionals, academic faculty and students with technical descriptions of key concepts, architectures, and engineering principles that form much of the basis of today's information technology industry. As such, the IBM journals are among the most cited journals in computer science.

About IEEE

IEEE is the world's largest technical professional society. Through its more than 375,000 members in 160 countries, IEEE is a leading authority on a wide variety of areas ranging from aerospace systems, computers and telecommunications to biomedical engineering, electric power and consumer electronics. Dedicated to the advancement of technology, IEEE publishes 30 percent of the world's literature in the electrical and electronics engineering and computer science fields, and has developed nearly 900 active industry standards. The organization annually sponsors more than 850 conferences worldwide. Additional information about IEEE can be found at http://www.ieee.org.

SOURCE IEEE