SANTA CLARA, Calif., Jan. 30, 2014 /PRNewswire/ -- UBM Tech's portfolio of communities for the electronics industry today announced the winners of the 2014 Best in Test Awards, selected by EDN editors and its online community. The Best in Test Awards recognize industry leaders in three categories: Best Test Product of the Year (Overall), Test Engineer of the Year, and Best in Test Product of the Year (in 10 different categories). Winners were announced during an awards ceremony held in conjunction with DesignCon 2014.
"For the past 23 years, we have been excited to honor and celebrate the best, most innovative advancements in an industry based on constant change," said Martin Rowe, Senior Technical Editor, EDN's Design Center and EE Times' Test and Measurement Designline, UBM Tech. "We congratulate this year's award winners, from the products, services and professionals for the superior efforts and ingenuity."
The Best in Test Product Awards honor important and innovative new products and services in the electronics test and measurement industry. Products from all areas of electronics testing and inspection are eligible. The Test Product of the Year Award is an overall winner of the Best in Test Product winners. The Test Engineer of the Year Award pays tribute to the important contributions test engineers make to the quality of electronics components, products and systems. The award winner receives a $10,000 educational grant, courtesy of sponsor National Instruments, which is presented to an engineering school designated by the winner.
Each year finalists are selected from among the nominees by EDN's editors, after which EDN's audience members are invited to vote for the winners using an online ballot. EDN then uses a combination of these audience votes and balloting by its editorial staff to determine the winners. The Best in Test Award winner that receives the most overall votes is named the Test Product of the Year.
The Best in Test winners:
- Manufacturing Test / ATE - J750Ex-HD Production Test System, Teradyne
- Data Acquisition - U5303A PCIe 12-bit High-Speed Digitizer with Custom On-Board Processing, Agilent Technologies
- Handheld / Portable Test - FieldFox Remote Control Capability, Agilent Technologies
- Machine Vision / Inspection - V810 XXL AXI, 3D In-Line Advanced X-Ray Inspection System, ViTrox
- Network Test (Wired, Wireless, Hybrid, Optical) - Spectra2 XL3 Core Network Test Software, Tektronix Communications
- Test Support: Programmable Power Supplies, Signal Generators, Etc. - NI PXIe-8383mc MultiComputing Module, National Instruments
- RF / Microwave Test - SMW200A Vector Signal Generator, Rohde & Schwarz
- Semiconductor Test - CM300 Probe System, Cascade Microtech
- Signal Integrity / High-Speed Test - NI PXIe-5162 Digitizer, National Instruments
- Software / Embedded Test - x1149 Boundary Scan Analyzer, Agilent Technologies
The 2014 Best Test Product is NI PXIe-8383mc MultiComputing Module from National Instruments.
The Test Engineer of the Year is Dr. Daniel Chow, Principal Signal Integrity Engineer of Apple.
For additional information on the awards program, visit: http://www.edn.com/design/test-and-measurement/4427734/EDN-announces-2014-Best-in-Test-Products
EDN is an online community designed for electronics design engineers, developers, and industry-related management. EDN provides engineers with the technology trends and design-how-to information they need to keep pace in this fast-paced environment, as well as the networking, contacts, mentoring, and peer-to-peer knowledge opportunities needed to take an idea from concept to reality.
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