Aehr Test Systems Receives Order for Its New Advanced Burn-in and Test System (ABTS(TM))

FREMONT, Calif., March 17 /PRNewswire-FirstCall/ -- Aehr Test Systems (Nasdaq: AEHR), a worldwide supplier of semiconductor test and burn-in equipment, today announced it has received an order for its new Advanced Burn-in and Test System (ABTS) from a leading Japanese semiconductor integrated device manufacturer (IDM). The system is configured for burning-in and testing advanced logic devices. The system is expected to ship during the second half of calendar 2010.

"We are pleased to have received this order for a new member of the ABTS family of systems," said Greg Perkins, vice president of worldwide sales and service at Aehr Test Systems. "We believe this order confirms the flexibility, quality and cost-effectiveness of the ABTS system for production burn-in and test of packaged ICs. The specific configuration this customer ordered is optimized to easily integrate into the customer's existing infrastructure, reinforcing the ABTS system's high degree of modularity and configurability. We hope to receive follow-on production orders for this version of the ABTS system."

The ABTS family of products is based on a completely new hardware and software architecture that addresses not only today's devices, but also future devices for many years to come. The system can test and burn-in memory devices as well as both high and low-power logic devices. The ABTS system can be configured to provide individual device temperature control for devices up to 100W or more and with up to 320 I/O channels. It uses an N+1 redundant technology for many key components in the system. This is intended to provide the highest possible system uptime.

About Aehr Test Systems

Headquartered in Fremont, California, Aehr Test Systems is a leading worldwide provider of systems for burning-in and testing memory and logic integrated circuits and has an installed base of more than 2,500 systems worldwide. Aehr Test has developed and introduced several innovative products, including the ABTS, FOX™, MTX and MAX systems and the DiePak® carrier. The ABTS system is Aehr Test's newest system for packaged part test during burn-in for both low-power and high-power logic as well as all common types of memory devices. The FOX system is a full wafer contact test and burn-in system. The MTX system is a massively parallel test system designed to reduce the cost of memory testing by performing both test and burn-in on thousands of devices simultaneously. The MAX system can effectively burn-in and functionally test complex devices, such as digital signal processors, microprocessors, microcontrollers and systems-on-a-chip. The DiePak carrier is a reusable, temporary package that enables IC manufacturers to perform cost-effective final test and burn-in of bare die. For more information, please visit the Company's website at www.aehr.com.

Safe Harbor Statement

This release contains forward-looking statements that involve risks and uncertainties relating to projections regarding customer demand and acceptance of Aehr Test's products. Actual results may vary from projected results. These risks and uncertainties include, without limitation, acceptance by customers of the ABTS technology, acceptance by customers of the ABTS systems shipped upon receipt of a purchase order, the ability of new products to meet customer needs or perform as described and the receipt of follow-on orders for this version of the ABTS. See Aehr Test's recent 10-K, 10-Q and other reports from time to time filed with the Securities and Exchange Commission (SEC) for a more detailed description of the risks facing our business. The Company disclaims any obligation to update information contained in any forward-looking statement to reflect events or circumstances occurring after the date of this press release.

SOURCE Aehr Test Systems