TSI Launches Next Generation Scanning Mobility Particle Sizer™ Spectrometer, Expanding Range to 1 nm
TSI Incorporated announces the launch of its new 1nm Scanning Mobility Particle Sizer™ (SMPS) Spectrometer
SHOREVIEW, Minn., Oct. 23, 2015 /PRNewswire/ -- TSI Incorporated, a global leader in precision measuring instrumentation, announces the launch of its new 1nm Scanning Mobility Particle Sizer™ (SMPS) Spectrometer.
TSI's SMPS Spectrometer is widely used as the standard for measuring size distributions of aerosols below one micrometer. With the addition of the Model 3777 Nano Enhancer and Model 3086 Differential Mobility Analyzer (1nm-DMA), the SMPS Spectrometer's size range has been expanded to 1nm.
When integrated with the SMPS spectrometer, the new 1nm Nano Enhancer 3777 enables researchers to measure the number concentration and size of aerosols with high resolution and speed from 1 nm. The Model 3777, together with TSI's 1nm-DMA has been optimized for minimal diffusion losses and can be integrated with an SMPS Spectrometer—capable of sizing from 1 nm to 50 nm, and expandable from 1 nm to 1 micrometer with the 3081A Long DMA.
"The 1nm CPC enables researchers to measure at the frontier of gas to particle conversion," said Jurgen Spielvogel, TSI's senior global product manager for particle instruments. Applications include materials science studies, atmospheric and climate research, fundamental aerosol research and particle nucleation and growth studies, among others.
For more information, please visit our Nano Enhancer 3777 and SMPS product pages.
Media contact:
Kara Johnson
TSI Incorporated
651-490-2723
SOURCE TSI Incorporated
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