SHOREVIEW, Minn., Oct. 16, 2016 /PRNewswire/ -- TSI will be exhibiting at the 35th Annual American Association for Aerosol Research (AAAR) Conference in Portland, Oregon from October 17-21, 2016. While learning about the latest aerosol science and technology research progress, TSI will be showcasing the 1nm Scanning Mobility Particle Sizer™ (SMPS™) and presenting the latest results at the conference.
For more than 30 years, TSI's SMPS spectrometers have been widely used as the standard for measuring aerosol size distribution in the submicrometer and low nanometer size range. The 1nm spectrometer is used for a variety of applications, including: the monitoring of new particle formation and kinetics in atmospheric research and aerosol based engineered nanoparticle synthesis in material science.
Learn how the 1nm SMPS can aide your research, optimize your processes, and take your measurements to the limit of detection. There will be two presentations that will take a more in depth look at various functions of the 1nm SMPS, one on Tuesday and Wednesday of the AAAR conference.
On Tuesday, Yang Wang of Washington University in St. Louis will be presenting a poster on Measuring flame-generated sub 3nm particle size distributions with a TSI 1-nm DMA and Nano enhancer.
On Wednesday, Jacob Scheckman, of TSI Incorporated, will talk on Transfer function of a new DMA and its use with a DEG-CPC for SMPS Measurements starting at 1nm.
For more information, stop by TSI's booth at the show, or visit www.tsi.com
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SOURCE TSI Inc.