Presented by Jennifer Hay, senior applications engineer for Nanomechanics, Inc., the lecture will focus on an elastic model for film-substrate interaction. This example returns accurate film moduli even when substrate influence is substantial. The new paradigm is applied to the interpretation of nanoindentation data on various thin films, including low-k films on silicon.
"Anyone responsible for or interested in nanoindentation should attend to quickly gain a comprehensive understanding of the test method and what it can do," said John Swindeman, CEO at Nanomechanics Inc. "We want to enable those working in the field with the latest information on instrumented indentation, from process and test engineers to graduate students."
For more information on the Instrumented Indentation - Session 8: Nanoindentation of Thin Films webinar, on Wednesday, Feb. 22 from noon to 1 p.m. EST, visit http://www.nanomechanicsinc.com.
About Nanomechanics Inc.
Nanomechanics Inc. designs and produces advanced nano-scale metrology products, including turnkey nanoindenters, modular devices for nano-scale actuation and sensing, and contract testing. Drawing on decades of experience in material science, precision mechanical design, and instrumentation software, Nanomechanics offers products that satisfy the intense demands of both industry and academia, with unparalleled ease-of-use, accuracy, up-time, and technical support. In addition to turnkey solutions, Nanomechanics provides modular components to microscopy companies in order to integrate nano-scale mechanical testing with advanced visualization. To learn more about what Nanomechanics is doing worldwide, please visit http://www.nanomechanicsinc.com/ or contact us at email@example.com.
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SOURCE Nanomechanics, Inc.