Registration Now Open for LIVE! 2014, the RFID Industry's Largest Event RFID Journal's 12th annual conference, to be held on Apr. 8-10, in Orlando, Fla., will open with a keynote presentation by Kim Phillips of Marks & Spencer.
NEW YORK, Nov. 13, 2013 /PRNewswire/ -- RFID Journal announced today that registration is now open for RFID Journal LIVE! 2014 (www.rfidjournalevents.com/live), the world's premier conference and exhibition focused on radio frequency identification (RFID) and its many business applications.
The event will open with a keynote presentation from Kim Phillips, Marks & Spencer's head of packaging. During this session, Phillips will share how the leading British retailer has embraced RFID at all of its stores. Attendees will learn why the company expects the technology's future potential benefits to provide greater visibility and accuracy of all stock at the item level, from when goods leave a supplier to when they move through the distribution chain and into stores, as well as an opportunity to reduce the costs of annual stock-taking. Plus, Phillips will address the loss of margin associated with excessive markdowns, theft and fraud.
LIVE! 2014 will be held on Apr. 8-10, at the Orange County Convention Center, located in Orlando, Fla. The event will feature four industry-specific and four level-of-expertise conference tracks, as well as eight in-depth preconference seminars and workshops, four post-conference seminars, fast-track training, the RFID Journal Awards, and one co-located event, IEEE RFID 2014. In addition, the conference will include exhibits and demonstrations conducted by the industry's leading technology firms.
The conference tracks will cover defense and aerospace, health care and pharmaceuticals, manufacturing, retail and apparel, and technology and infrastructure, as well as how to deploy RFID, enhance visibility and traceability, and improve supply chain and logistics. The preconference seminars will provide in-depth education regarding RFID's use in harsh environments, for IT professionals, for warehouse and inventory management and in the food chain, and will also include RFID Journal University, the company's most popular preconference. Workshops will focus on Near Field Communication (NFC), item-level retail and apparel, and the strategic use of RFID. Post-conference seminars will include the RFID in Manufacturing Technical Workshop, the Benchmarking UHF RFID Hardware Master Class, the NFC Application Developers Master Class, and RFID and The Internet of Things.
The co-located event, IEEE RFID 2014, will offer a series of conferences addressing theoretical, technical and implementation issues related to RF-based identification and communication systems. This conference will be sponsored by the IEEE Technical Committee on RFID (CRFID), a group specially chartered to address RFID-related issues.
"RFID adoption is clearly accelerating, and we expect to have a program filled with new and exciting case studies in 2014," said Mark Roberti, RFID Journal's founder and editor. "What's more, the technology is advancing at a rapid clip, so attendees will be able to view the latest products that can help solve their business problems, boost efficiencies, cut costs, improve on-shelf availability and much more."
Attendees registering early will have the opportunity to save more than $600 off regular rates for the RFID industry's most important conference and exhibition. For additional information regarding LIVE! 2014, please visit www.rfidjournalevents.com/live.
About RFID Journal
RFID Journal is the leading source of news and information regarding radio frequency identification (RFID) and its many business applications. Business executives and implementers depend on RFID Journal for up-to-the-minute RFID news, in-depth case studies, best practices, strategic insights and information about vendor solutions. This has made RFID Journal the most relied-upon and respected RFID information resource, serving the largest audience of RFID decision makers worldwide—online and at face-to-face events. For more information, visit www.rfidjournal.com.
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