Learn how the 1nm SMPS can aide your research, optimize your processes, and take your measurements to the limit of detection. There will be two presentations that will take a more in depth look at various functions of the 1nm SMPS, one on Tuesday and Wednesday of the AAAR conference.
On Tuesday, Yang Wang of Washington University in St. Louis will be presenting a poster on Measuring flame-generated sub 3nm particle size distributions with a TSI 1-nm DMA and Nano enhancer.
On Wednesday, Jacob Scheckman, of TSI Incorporated, will talk on Transfer function of a new DMA and its use with a DEG-CPC for SMPS Measurements starting at 1nm.
For more information, stop by TSI's booth at the show, or visit www.tsi.com
To view the original version on PR Newswire, visit:http://www.prnewswire.com/news-releases/tsi-to-attend-35th-annual-aaar-conference-300345480.html
SOURCE TSI Inc.